The Microscopy & Microanalysis Unit's Instruments

Find detailed information about the Australian Museum
Microscopy & Microanalysis Unit's state-of-the-art instruments:

Variable Pressure SEM

Martin Pueschel © Australian Museum

Scanning Electron Microscope

Zeiss EVO LS 15 SEM: Variable Pressure SEM  [ see image > ]
  • Tungsten gun
  • Everhart-Thornley Secondary Electron Detector
  • Zeiss VPSE G3 detector
  • Robinson Backscatter Detector
  • Zeiss Backscatter Detector
  • ADDA III SEM/STEM Scan Interface

X-ray Powder Diffraction System

PANanalytical X’Pert Pro XRD  [ see image > ]
  • PW3050/60: Theta 2 Theta with Flat sample stage, Sample stage spinner, fixed divergence split line optics assembly, width mask (20mm, 15mm, 10mm, 5mm), Divergence slit (4 deg, 2 deg, 1 deg, ½ deg, ¼ deg), Scatter-slit (4 deg, 2 deg, 1 deg, ½ deg, ¼ deg), fixed slit interface, High score plus software with ICCD PDF-4/ Minerals 2009 database.

Portable XRF Analyzer

Bruker AXS Handheld Tracer IIIV system

SEM Specimen Preparation:

  • Critical Point Dryer - BAL-TEC CPD 030
  • Gold Sputter Coater Unit – EMITECH K550
  • Carbon Coater Unit – EMITECH K250
  • Mini Freeze Drier – Dynavac
  • Sonicator
  • Ovens

Light Microscopes and Image Capturing Systems

  • Leica MZ 16 stereo dissection microscopes
  • Leica MZ 16 stereo microscope with polarization and transmitted light base
  • Olympus BX50 Microscope with polarization, DIC, 100x UPlanFl oil, 40x UPlanFl, 20x UPlanFl, 10x UPlanFl.
  • Leica 35mm camera system
  • Spot Flex Digital Camera System
  • Nikon D3X, Canon D7 Micro Imaging System with Infinity Long Distance Microscope tube and Objectives (CF2, CF3, CF4, CF5, HDF2). ML-1000 illuminator, Micro Nikkor 105mm f/2.8D and 60mm f/2.8D lens, Canon EFS 18-200mm f/305-5.6 IS lens.
    - Auto Montage, Photoshop CS4, Genuine Fractle 4, Helicon Focus 5 Pro.
    - Nikon SF-200 super coolscan 400ED

> Visit our Micrographs Gallery.




Mr Martin Pueschel , Scientific Illustrator
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